Abstract
This work reports the formation of planar and channel waveguides in Nd:YVO4 by carbon implantation, using doses as low as 5 × 1014 ions/cm2. The analysis includes refractive index profiles, propagation losses and spectroscopic properties. The results indicate that there is an index convergence, the ordinary index increases while the extraordinary index decreases. The spectroscopic studies show that emission bands coming from the 4F3/2 level are not altered by the ion beam process, shedding light on the potential of carbon implanted waveguides for laser integrated devices.
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