Abstract
Mn-doped Ga1−xMnxAs epilayers grown on semi-insulating (100) GaAs substrates using the liquid phase epitaxy technique were investigated using photoluminescence and Hall effect measurements from 20 to 300 K. Transitions involving shallow Mn acceptors were identified through photoluminescence measurements and the ionization energy of Mn acceptor was determined to be 104.6 meV which is in good agreement with values calculated from a hydrogenic hole model including sp–d exchange contribution. Also, it was concluded that Ga1−xMnxAs alloys were obtained from samples with low Mn concentration (below x≈1%) and these layers have a simple impurity band merging to the valence band.
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