Abstract
Sn-doped In0.5Ga0.5P epilayers, grown on semi-insulating (100) GaAs substrates by the liquid phase epitaxy technique, have been investigated using photoluminescence and Hall effect measurements from 15 to 300 K. The Sn dopant in InGaP shows amphoteric behavior with a compensation ratio of ∼0.4–0.6. Transitions involving shallow Sn acceptors have been identified through photoluminescence measurements for the first time and the ionization energy of Sn was determined to be 57 meV, which is in good agreement with the hydrogenic acceptor value. It was also found that the Sn shallow donor has an ionization energy 17–12 meV with increasing carrier concentrations through Hall measurements.
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