Abstract
92 % Pb ( Mg 1 ∕ 3 Nb 2 ∕ 3 ) O 3 – 8 % Pb Ti O 3 (PMNT) thin films have been prepared on Pt∕Ti∕SiO2∕Si substrate with a LaNiO3 buffer layer and on sapphire substrate by a chemical solution deposition method. X-ray diffraction analysis shows that the PMNT thin films on Pt∕Ti∕SiO2∕Si substrate are polycrystalline with (110)-preferential orientation. The optical properties of PMNT thin film in 2.5–12.5μm and 200–1100nm ranges have been investigated using infrared spectroscopic ellipsometry and ultravisible transmission spectra, respectively. The optical constants and thickness of the thin films have been obtained by fitting the measured ellipsometric parameter (Δ and Ψ) data and transmission spectrum with classical infrared and Tauc-Lorentz models. The optical band gap energy of the PMNT thin films on sapphire substrate is derived to be about 4.02eV.
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