Abstract
The optical constants and thickness of CdSe thin films prepared by quasi close-space sublimation method are determined. The structural investigations performed by means of XRD technique showed that the films have a polycrystalline and hexagonal structure. The optical constants and the band gap of the films under study have been determined (Eg= 1.68 eV). Optical properties (refractive index n(λ), absorption coefficient α(λ), and extinction coefficient k(λ)) of thin films and thickness d can be determined from the transmission spectrum. The dispersion of the refractive index was explained using a single oscillator model. Single oscillator energy and dispersion energy are obtained from fitting. Optical parameters of the films were determined using the Cauchy, Sellmeier and Wemple models.
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