Abstract
Atomic force microscopy (AFM) has been used extensively in nanoscience research since its invention. Recently, many teaching laboratories in colleges, undergraduate institutions, and even high schools incorporate AFM as an effective teaching tool for nanoscience education. This paper presents an optical beam deflection (OBD) based atomic force microscope, designed specifically for the undergraduate engineering laboratory as a teaching instrument. An electronic module for signal conditioning was built with components that are commonly available in an undergraduate electronic laboratory. In addition to off-the-shelf mechanical parts and optics, the design of custom-built mechanical parts waskept as simple as possible. Hence, the overall cost for the setup is greatly reduced. The AFM controller was developed using National Instruments Educational Laboratory Virtual Instrumentation Suite (NI ELVIS), an integrated hardware and software platform which can be programmed in LabVIEW. A simple yet effective control algorithm for scanning and feedback control was developed. Despite the use of an educational platform and low-cost components from the undergraduate laboratory, the developed AFM is capable of performing imaging in constant-force mode with submicron resolution and at reasonable scanning speed (approximately 18 min per image). Therefore, the AFM is suitable to be used as an educational tool for nanoscience. Moreover, the construction of the system can be a valuable educational experience for electronic and mechanical engineering students.
Highlights
As nanoscale science, technology, and engineering have grown phenomenally over the past few decades, awareness of nanotechnology and nanoscience concepts and implications is increasingly important in education
The purpose of this work is to utilize existing resources that are available from the undergraduate laboratory and build a cost-effective Atomic Force Microscopy (AFM) as a teaching instrument
An optical beam deflection (OBD) based AFM designed as a teaching instrument for the undergraduate engineering laboratory was presented
Summary
Technology, and engineering have grown phenomenally over the past few decades, awareness of nanotechnology and nanoscience concepts and implications is increasingly important in education. Scanning Probe Microscopy (SPM), proclaimed to be the key to enabling discovery for nanotechnology, has evolved into a series of profound techniques for interdisciplinary research at the nanoscale. Atomic Force Microscopy (AFM) [1], a family member ofSPM, is one of the most versatile techniques for surface analysis. Over the past three decades, it has evolved into a powerful tool used to image and measure interatomic or intermolecular forces, for a wide range of surfaces including those encountered in the semiconductor and biomaterial industries. The ability of AFM to operate under a liquid environment makes it an indispensable tool for studies of solid-liquid
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