Abstract
The LabVIEW-based educational atomic force microscope (AFM) with National Instruments Educational Laboratory Virtual Instrumentation Suite (NI ELVIS) as the controller platform was built previously. However, it has limited function. Modification is needed to enhance the graphical user interface (GUI) so that more advanced features can be integrated into the existing platform. In this study, the force measurement function is introduced into the existing AFM system. Other additional features such as calibration of the cantilever spring constant and data storage are integrated into the system as well.
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