Abstract
Investigations of low-frequency conductance fluctuations have been done on silver films which have been made to undergo electromigration damage. The system shows a clear increase in noise magnitude after electromigration damage. The noise spectral power shows a distinct presence of 1/f3/2 component arising out of long-range diffusion. The temperature dependence of noise (150 K<T<350 K) shows a marked deviation from the Dutta–Horn type behavior with the 1/f3/2 term showing a strong dominance at higher temperatures. We propose that the increase of noise in metal films after electromigration damage arise predominantly from this spectral component.
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