Abstract
The yields of both ionic and neutral clusters sputtered from ion bombarded metal surfaces were determined as a function of the target temperature. For the case of secondary ions emitted from a polycrystalline silver surface under 12-keV Xe+ bombardment, a drastic yield enhancement is observed with increasing target temperature. The magnitude of this effect is different for atomic and cluster ions in such a way that the emission of larger cluster ions is favored at higher temperature. In order to elucidate the physical reason for this behavior, a second set of experiments was performed in which the yields of sputtered neutral clusters and secondary cluster ions have been determined in situ under otherwise identical experimental conditions, the neutral species being post-ionized using pulsed laser photoionization. It is seen that the yields of sputtered neutrals are essentially independent of the target temperature. The yield enhancement observed for the secondary ions must therefore be due to a temperature dependence of the ionization probability characterizing the secondary ion formation process. Possible causes for this finding are discussed.
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