Abstract
A silicon bent perfect crystal in fully asymmetric diffraction (FAD) geometry in combination with a linear position-sensitive detector can be effectively used for high-resolution analysis of a beam scattered by a sample. The results of the first promising time of flight (TOF) experimental tests of λ scanning carried out with the FAD of cylindrically bent Si slabs of different cuts are presented. The length and the homogeneous curvature of the crystal determine the range of Δλ/λ of about 10-2 that could be investigated with the accuracy of δk/k≈10-4. The obtained experimental results indicate that the FAD geometry of the bent Si slab in combination with a one-dimensional position-sensitive detector could be a good candidate for a high-resolution analyzer at some of the TOF instruments.
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