Abstract
The results of direct comparison of some monochromator properties of plastically deformed (mosaic) Ge single crystal with cylindrically bent perfect crystal (BPC) of Si are presented. Using a double-crystal diffractometer and α o=20′ collimation of the incident polychromatic beam we compared monochromatic beam current at the sample position for the take off angles of 40°, 50° and 60°. The comparison was carried out on the diffraction planes (3 1 1) M when the monochromators operated at nearly the same asymmetric diffraction geometry. For the sake of comparison of their resolution properties, Fe(1 1 0) and Fe(2 1 1) diffraction profiles of the beam scattered by a solid and well annealed α-Fe polycrystalline sample are also presented. It has been found that under these specific experimental conditions often used for residual strain scanning, the focusing bent Si crystal is a good cheap alternative to the flat mosaic Ge monochromator.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call