On a logical fault model H1SGLF for enhancing defect coverage

Abstract

This paper presents a logical fault model, the single gate logical fault with Hamming distance 1 (HISGLF) model, designed to enhance the defect coverage of test sets. Although some characteristics of the HISGLF model are similar to those of the single stuck-at fault (SSAF) model, a test set derived from the HISGLF model is capable of covering more defects than one derived from the SSAF model. Most of the existing ATPGs for the SSAF model can be easily modified for the H1SGLF model. Experimental results show the effectiveness of the fault model.