Test Set Enrichment using a Probabilistic Fault Model and the Theory of Output Deviations

Abstract

We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theory of output deviations, can be used to supplement tests for classical fault models, thereby increasing test quality and reducing the probability of test escape. Output deviations can also be used for test selection, whereby the most effective test patterns can be selected from large test sets during time-constrained and high-volume production testing. Experimental results are presented to evaluate the effectiveness of patterns with high output deviations for the single stuck-at and bridging fault models