Abstract
The dispersion characteristics of fin lines with arbitrary dimensions can be obtained from data published for fin lines centered in standard waveguide enclosures. The procedure is based on the transverse resonance method which has been widely used in the past to evaluate the properties of slab-loaded waveguides, ridged waveguides and similar structures.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have