Abstract
We report a new measurement of the soft-x-ray ${M}_{2,3}$ emission spectrum of Cu, using improved experimental techniques. Previously unreported fine structure was observed in the spectrum. Although exact correction for satellite and subband overlap and self-absorption effects is not yet possible, careful consideration has been given to them, with the result that the ${M}_{3}$ band profile can be resolved from the accompanying structure in a plausible way. Its features can be taken with reasonable confidence to be characteristic of the true ${M}_{3}$ profile. Comparison is made with the complementary ${L}_{3}$ soft-x-ray profile, with band-theoretical estimates of both experimental x-ray profiles, and with the results of ultraviolet-photoemission, x-ray-photoemission, and ion-neutralization measurements. These comparisons favor a single-particle description of the occupied bands of Cu.
Published Version
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