Abstract
physica status solidi (b)Volume 149, Issue 1 p. K73-K76 Short Note Oblique Incidence Specular Reflectivity of Uniaxial Semiconductors near Three-Dimensional Critical Points O. Foltin, O. Foltin Department of Physics, Faculty of Electrical Engineering, Slovak Technical University, Bratislava Search for more papers by this author O. Foltin, O. Foltin Department of Physics, Faculty of Electrical Engineering, Slovak Technical University, Bratislava Search for more papers by this author First published: 1 September 1988 https://doi.org/10.1002/pssb.2221490157 Mlynska dolina, CS-81219 Bratislava, Czechoslovakia. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Volume149, Issue11 September 1988Pages K73-K76 RelatedInformation
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