Novel bandgap-based under-voltage-lockout methods with high reliability

Abstract

Highly reliable bandgap-based under-voltage-lockout (UVLO) methods are presented in this paper. The proposed under-voltage state to signal conversion methods take full advantages of the high temperature stability characteristics and the enhancement low-voltage protection methods which protect the core circuit from error operation; moreover, a common-source stage amplifier method is introduced to expand the output voltage range. All of these methods are verified in a UVLO circuit fabricated with a 0.5 μm standard BCD process technology. The experimental result shows that the proposed bandgap method exhibits a good temperature coefficient of 20 ppm/°C, which ensures that the UVLO keeps a stable output until the under-voltage state changes. Moreover, at room temperature, the high threshold voltage VTH+ generated by the UVLO is 12.3 V with maximum drift voltage of ±80 mV, and the low threshold voltage VTH− is 9.5 V with maximum drift voltage of ±70 mV. Also, the low voltage protection method used in the circuit brings a high reliability when the supply voltage is very low.