Abstract
Doped-ion based optical elements play key roles in optical signal processes, including amplification, absorption, wavelength-filtering, lighting, and polarizing plate. Non-invasively mapping the spatial distribution of the ion concentrations in these optical elements is highly desirable either during the fabrication process or to determine their optical qualities. In this work, we applied modified two-photon fluorescence (m-TPF) microscopy to trace the ion-distributions deep inside the optical elements. For demonstration purposes, polyvinyl alcohol (PVA) polymer films inside polarizing plates are taken as an example, where the spatial distributions of Iodine-dyed ions were measured by the m-TPF microscope in a fast and non-invasive way. The durability of the polarizer films can be distinguished from the axial distribution of the Iodine-dyed ions, without the need to perform a biopsy. This proposed method and demonstrated results show great potential for monitoring the spatial distributions of doped-ions in the optical elements quickly and non-destructively, which would be of great benefit in both scientific research and industrial applications.
Highlights
By doping various active-ions within transparent optical substrates, various optical functions, including optical amplification [1, 2], absorption [3], wavelength filtering [3, 4], solid-state lighting [5] and polarization distinction [6, 7], can be performed
Polyvinyl alcohol (PVA) polymer films inside polarizing plates are taken as an example, where the spatial distributions of Iodine-dyed ions were measured by the m-TPF microscope in a fast and non-invasive way
The durability of the polarizer films can be distinguished from the axial distribution of the Iodine-dyed ions, without the need to perform a biopsy
Summary
By doping various active-ions within transparent optical substrates, various optical functions, including optical amplification [1, 2], absorption [3], wavelength filtering [3, 4], solid-state lighting [5] and polarization distinction [6, 7], can be performed. It is essential to monitor the spatial distribution and uniformity of dopants in laser crystals, color-glass filters, white OLEDs and polarizers. Molecular concentration imaging can be performed by measuring the intensities of higher-energy fluorescence photons, with a natural depth discrimination capability and high spatial resolutions in the focal plane. A different approach, which we call modified two-photon fluorescence (mTPF) microscopy, was utilized to trace the doped-ion concentrations deep inside transparent optical substrates. 2D images of the relative ion concentrations, comparable to traditional microscopic images of sliced samples, were obtained without any physical biopsy These demonstrated results show that the m-TPF has great potential for monitoring the spatial distributions of doped-ions inside the optical substrate quickly and non-destructively, which will be of benefit in both scientific research and industrial applications
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