Abstract
In this work the effects of Hydrogen and Argon ions on Aluminum samples and the spatial distribution of the ions in 2.5 kJ SBUPF1 Mather type plasma focus device in different distance from the anode top have been investigated. For each gas the pressure and operation voltage have been determined to have maximum ion density. Aluminum samples were placed at different distances above the anode. Irradiated samples have been analyzed with SEM technique for morphological and surface study of samples. Melting and surface evaporation effects and generation of cracks were seen in these samples. The result of ions patterns on these samples can be used to determine ions spatial distribution on top of the anode region. The EDX spectroscopy and the SRIM calculations have been done to determine the composition of samples and the penetration depth of the ions in the samples respectively.
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