Abstract
The electronic properties of a clean Si (110)-“16×2” surface have been studied by angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) and surface differential reflectivity (SDR). Four surface states have been recognized by ARUPS and their dispersions have been mapped along the main symmetry lines in the surface Brillouin zone. SDR experiments revealed transitions between filled and empty surface states at ~ 1.8, 2.4, and 2.9 eV. The results are explained on the basis of a new structural model of the Si (110)-“16×2” phase.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
