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https://doi.org/10.1007/s10825-022-01986-7
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Cite Journal: Journal of Computational Electronics |  Publication Date: Dec 20, 2022 |
 Citations: 1 |
Negative capacitance silicon nanotube FET: a subthreshold modeling exploration of sub-60 mV/decade swing, negative drain-induced barrier lowering, and threshold voltage roll-off
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