Abstract
A near-field microspectroscopy system was developed for fluorescence analyses of tetracene microcrystals. Topographies, fluorescence images, and spectra of microcrystals with size of sub μm – a few μm were measured with ∼100 nm spatial resolution. The relative intensities of two emission bands of the fluorescence spectra were shown to be different between individual microcrystals. The dependence of fluorescence spectra upon crystal thickness was found by correlating topographies with fluorescence images, and discussed in view of the distribution of defect-sites at the surfaces and interfaces.
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