Abstract
Interplanetary Dust Particles (IDPs) are derived from primitive Solar System bodies like asteroids and comets. Studies of IDPs provide a window onto the origins of the solar system and presolar interstellar environments. We are using Total Reflection X-ray Fluorescence (TXRF) techniques developed for the measurement of the cleanliness of silicon wafer surfaces to analyze these particles with high detection sensitivity. In addition to elemental analysis of the particles, we have collected X-ray Absorption Near-Edge spectra in a grazing incidence geometry at the Fe and Ni absorption edges for particles placed on a silicon wafer substrate. We find that the iron is dominated by Fe2O3.
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