Abstract

This study involved an investigation of the structural, electrical, and multiferroic properties of a BiCrO3/BiFeO3 (BCO/BFO) double-layered thin film that was prepared on a Pt(111)/Ti/SiO2/Si(100) substrate by using a chemical solution deposition method. X-ray diffraction and Raman spectroscopy studies revealed the formation of tetragonal and rhombohedral structures for the BCO/BFO double-layered thin film without any detectable secondary phases. A saturated ferroelectric hysteresis loop with a remnant polarization (2Pr) of 37μC/cm2 and a coercive field (2Ec) of 1004kV/cm at an applied electric field of 1154kV/cm and a ferromagnetic hysteresis loop with a 2Mr value of 0.044emu/cm2 and a 2Hc value of 276Oe at a magnetic field of 10kOe were observed for the BCO/BFO double-layered thin film at room temperature. The leakage current density of the BCO/BFO double-layered thin film was 2.88×10−4A/cm2 at an external electric field of 100kV/cm. The enhanced multiferroic properties observed for the BiCrO3/BiFeO3 thin film correlated with its net effects, such as a decrease in the oxygen vacancy density, a stabilization of the perovskite structure, and small changes in the lattice parameter caused by compressive strain resulting from the coupling of the BiFeO3 and BiCrO3 layers.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call