Abstract
The structural, electrical, and multiferroic properties of the double-layered (Bi0.95La0.05)(Fe0.97Cr0.03)O3/NiFe2O4 thin film deposited on a Pt(111)/Ti/SiO2/Si(100) substrate by a chemical solution deposition method are reported. The formation of the perovskite-based distorted rhombohedral and spinel phases was confirmed by X-ray diffraction analysis and Raman spectroscopy. The surface morphology and film thickness were analyzed by field emission scanning electron microscopy. The low leakage current density (5.83×10-7 A/cm2 at 100 kV/cm) was measured from the double-layered thin film. Potential multiferroic properties, such as a well-saturated ferroelectric hysteresis loop with large 2 Pr (61 µC/cm2) and 2 Ec (652 kV/cm) (at an applied electric field of 952 kV/cm), and a ferromagnetic hysteresis loop having 2 Mr (18.6 emu/cm3) with 2 Hc (0.943 kOe) (at an applied magnetic field of 20 kOe), were observed from the double-layered thin film.
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