Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)

Peida Zhao,Joy Cho,Ruixuan Wang,Yingbo Zhao,Ali Javey,Der‐Hsien Lien,Geun Ho Ahn,Hyungjin Kim

doi:10.1002/adma.201970340

Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)

Peida Zhao, Joy Cho + Show 6 more

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https://doi.org/10.1002/adma.201970340

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Journal: Advanced Materials

Publication Date: Nov 1, 2019

Affiliation: University of California, Berkeley, Lawrence Berkeley National Laboratory

#Monolayer Semiconductors #Scanning Probe Lithography #Edge Recombination #Lithography Patterning #Scanning Probe

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Author(s): Zhao, Peida; Wang, Ruixuan; Lien, Der‐Hsien; Zhao, Yingbo; Kim, Hyungjin; Cho, Joy; Ahn, Geun Ho; Javey, Ali

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Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)