Abstract
Monocrystalline CdTe films of (1¯1¯1¯) orientation were deposited on GaAs (100) with a vicinal angle of ≈2°. The orientation and monoclinic distortion of the films vary at 25–400°C because of the large differences in lattice constants and thermal expansion coefficients. X-ray diffraction measurements by the Bond method show a monoclinic distortion and a tilting with respect to the substrate by 1.33°–1.44°.
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