Abstract
We report investigations on temperature-induced transformation of magnetic domain structures and magnetization reversal process in as-cast and annealed co-rich amorphous glass covered microwires. The images of domain structures and hysteresis loops were obtained using magneto-optical Kerr microscopy. The directed shift of the hysteresis loop along the field axis was observed during the temperature increase and decrease in the annealed wire. The mechanism of the observed effect is based on the strong influence of the temperature-induced transformation of the internal stresses in the outer shell of the microwire. The studied microwires could be considered as candidates for the active element of the temperature sensor.
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