Abstract
Surface magnetization reversal of Co-rich and Fe-rich amorphous glass covered microwires in the presence of torsion mechanical stress has been studied by magneto-optical Kerr effect. The dependence of the angle of the helical anisotropy on the applied torsion stress has been obtained based on the analysis of the magneto-optical experimental results. The value of the limit angle of the torsion stress induced helical anisotropy has been found. The influence of temperature on surface magnetic structure and magnetization reversal process under electric current and external magnetic field has been investigated. It was found different types of domain structures depending on the temperature and the microwire composition. These types are characterized by the different domain period and the angle of the inclination of domain walls. It was established the direct correlation between surface domain structures and hysteresis loops. It was observed original mechanism of the domain structure transformation—unusual change in the domain structure without movement of domain walls. It was found that the high-frequency electric current at room temperature has a great and essential influence on the surface magnetization reversal and surface domain structure. The induced formation and transformation of the surface magnetic structure are key processes that determine the stable operation of giant magneto-impedance devices.
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