Abstract
Tapping mode atomic force microscopy provides good resolution in imaging applications,but it still requires a time-consuming initial configuration and features quite low scanningvelocity. In this paper we present a new dynamic mode in which the cantilever gets excitedby a feedback loop containing a saturation function. The proposed scheme is thenanalysed in the frequency domain and simulated against the standard set-up,showing good performance and elimination of some of the known drawbacks.Preliminary results in experiments confirm the effectiveness of this operatingmode.
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