Abstract
An axially symmetrical strain model has been proposed to evaluate the residual strain distribution induced by gradual variation of composition in a bulk mixed crystal system. The strain components in cylindrical coordinates are analytically derived by using a stress function technique. The results obtained from the model demonstrate that the quantitative amount of strains and their distributions are highly sensitive to the compositional profile and its range. The strain model is confirmed by comparing photoluminescence (PL) and energy dispersive X-ray (EDX) experiments performed in a bulk InxGa1-xAs mixed crystal grown by the conventional freezing method. It is found from the PL and EDX results that there exists a large amount of strain induced by gradual variation of composition, which is well explained by the model proposed here.
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