Abstract
Abstract The structure and photo-doping effect on Sr 2 FeMoO 6 are investigated using the X-ray powder diffraction and positrons annihilation technique, respectively. Anti-site defect is about 8.8%, can be estimated directly from the XRD pattern, which is well consistent with that of obtained from the XRD refinements. The integral intensity ratio of the reflection (1 0 1) and the reflections (2 0 0) and (1 1 2) may used to estimate the concentration of the anti-site defect. The positron annihilation lifetime in Sr 2 FeMoO 6 is sensitive to photo-doping. The average lifetime and the electron density n e vary with photo-doping.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
