Abstract
The structure, electrical properties, and thermal stability of 2 mol% MnO2-doped 0.12Pb(Ni1/3Ta2/3)O3-xPbZrO3-(0.88-x)PbTiO3 (abbreviated as PNT-xPZ-PT-Mn, x = 0.41, 0.42, 0.43, 0.44) ceramics were systematically investigated to analyze the impact of varying PZ content within the range of 0.41–0.44. In addition, the high temperature polarization method was employed to achieve enhanced electrical performance. Notably, optimized electrical properties of d33 = 400 pC/N, Qm = 757, FOM = 3.0×105 pC/N and kp = 0.616 were obtained for the PNT-0.43PZ-PT-Mn ceramics. The enhanced electrical properties observed in this study could be attributed to the presence of dielectric relaxor behavior, and the manifestation of ferroelectric hysteresis effects. In particular, d33 and kp values exhibited a consistent trend from the room temperature to the Curie temperature, thereby indicating the remarkable thermal stability of PNT-0.43PZ-PT-Mn ceramics. This study presented a systematic approach to enhance the properties of PZT-based materials.
Published Version
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