Abstract
On-chip ESD protection is a major reliability problem to ICs. Human body model (HBM) and charged device model (CDM) are fundamentally different ESD phenomena. This review depicts a big common misconception in CDM ESD protection designs. It is well known that CDM ESD is much faster than HBM ESD, therefore, vast design efforts for CDM ESD protection has been devoted to making an CDM ESD protection device faster. Our study concludes that the commonly used pad-based ESD protection methods, while working well for “external-oriented” HBM ESD protection, are theoretically faulty for the “internal-oriented” CDM ESD protection. This misconception with pad-based CDM ESD protection designs is believed to be the root cause to the mystery of CDM ESD failures today.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
