Abstract
The Y5V-1206 base-metal electrode (BME) multilayer ceramic capacitor (MLCC) chips have been characterised for crystalline phases using X-ray diffractometry (XRD), and microstructure using optical microscopy (OM), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The microstructure features found in the Ni electrode and the BaTiO3 dielectric layer are discussed in terms of the tensile backstresses induced upon firing due to constrained sintering heterogeneously. The chemical compositions containing BaO-excess and additives CaO and ZrO2, determined for BaTiO3 grains by energy-dispersive spectroscopy (EDS) equipped in the TEM are also reported. However, no rare-earth oxides were found in the grains. The representative microstructure of BaTiO3 grains containing dislocations is the “solid-solution” type distinctive from the “core-shell” of the X7R compositions. The fact that no ferroelectric domains were detected suggests that the BaTiO3 grains are pseudo-cubic with the c/a ratio ≈ 1.0.
Published Version
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