Abstract
In the framework of the revision of the high dc resistance scale from 10kΩ to 1TΩ at National Institute of Metrological Research (INRIM) a measurement method for calibration of high value resistors based on the use of a digital multimeter (DMM) and of a dc voltage calibrator (DCVC) was projected, developed and characterized. A method based on the Hamon scaling technique was revised and extended to 1GΩ. Two other methods, based respectively on a modified Wheatstone bridge and on a current comparator bridge, were implemented. A new 100MΩ step Hamon standard, a humidity generator to characterize high value resistors vs. relative humidity and a scanner for high resistances were developed and characterized. The relative 2σ best measurement capabilities, obtained in the range 10kΩ÷1TΩ at INRIM with all these methods, span from 2.0×10−7 of the 10kΩ standard resistor at the measurement voltage of 10V to 1.0×10−3 of the 1TΩ standard resistor at a voltage of 100V. The relative standard uncertainties of the utilized methods at INRIM are summarized.
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