Abstract
In this paper, to design an EMI filter effectively, a method for insertion loss of an EMI filter connected to a semiconductor power converter is proposed. Conducted EMI noise that flows from the converter should conform to the regulations of an international commission, such as International Electrotechnical Commission (IEC). In order to conform to such regulations, EMI filters have to be connected to power converters. In general, the performance of the EMI filter is evaluated on the basis of the insertion loss of 50Ω measurement system. However, the impedance of the power converters is usually not set to 50Ω. As a result, the EMI filter design is often performed using a trial-and-error method because the noise reduction effect is different from the insertion loss. In this work, for simplicity, a power converter is considered to be a capacitor, instead of a stray capacitor. Then, a method for evaluating the insertion loss of an EMI filter connected to the power converter is proposed. This proposed method is employed using the 50Ω measurement system and the capacitance. The proposed method helps to design the EMI filter because the derived noise reduction effect corresponds to the experimental one.
Published Version
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