Abstract
Biaxially textured CeO 2-based oxide films with crack-free and smooth surface were prepared by metal-organic deposition (MOD) on Ni-W alloy tapes after annealing. In this study, addition of B 2O 3-based precursors to precursor solution and their effects on crystallinity and surface roughness of the CeO 2-based oxide films were investigated. As the amount of added B 2O 3-based precursors increased, the relative intensity of CeO 2 (200) peak was monotonously increased and much smoother surface was obtained. Microcracks in CeO 2 films were successfully suppressed by substituting gadolinium for part of cerium in the CeO 2 films. In addition to this, a biaxially textured Ce 0.75Gd 0.25O 2-4.5% B 2O 3 film (Δ θ = 4.8°, Δϕ = 7.4°) with smooth surface ( R q = 2.7 nm) was successfully grown on the Ni-W tape after annealing at 900 °C.
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