Abstract

The photothermal deflection technique has been used for contactless measurements of the thermal conductivity of thin polycrystalline diamond films grown in a dc arc discharge in different CH4/H2 mixtures. The thermal conductivity correlates inversely with amorphous sp2 carbon content in the films. Values of thermal conductivity in the range 2–5 W/cm K were obtained for ∼10-μm-thick diamond films deposited from gas mixtures containing methane percentages varying from 3% to 9%.

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