Abstract
Photon autocorrelation measurements are used to investigate the power dependent single photon emission of recently reported interface fluctuation GaN quantum dots (QDs), which exhibit relatively narrow emission linewidths. The intrinsic exciton lifetime of such a dot is evaluated to be 2.0 ± 0.1 ns from its power dependent single photon dynamics. This result is comparable with typical SK GaN QDs that emit at similar energy, and provides further evidence that the relatively narrow emission linewidth in such structures results from a cleaner dot environment.
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