Abstract
Measurement at millimeter wavelengths of the dielectric properties of low loss materials by a free space technique is described. The dielectric constant is determined from the Brewster angle, and the dielectric loss tangent from the attenuation coefficient measured at the Brewster angle of incidence. Results are given for bakelite at wavelengths between 5 and 10 mm. Details of the instrument, which was specifically designed for these measurements, are also given.
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