Characterization of Dielectric Properties of Low Loss Materials at 300°C at Millimeter Wave

Abstract

In this paper we designed an automatic millimeter wave test system based on the quasi optical resonator method, which can continuously test the dielectric properties of materials at single and multi frequency points in the frequency band of 20~50GHz. The initial dielectric value of the tested material is determined by the internal integration of the software, and the initial dielectric value is used as the initial value of the subsequent mode iteration to realize the one key automatic test. The system has the characteristics of high degree of automation, wide test frequency band and high test precision. The system is used to test common millimeter wave communication materials such as alumina ceramics and sapphire at 300 °C, and compared with the literature data. The design system can meet the needs of millimeter wave high temperature testing of dielectric materials.