A dielectric resonator method of measuring dielectric properties of low loss materials in the microwave region

Abstract

A technique for the measurement of dielectric properties of low loss and homogeneously isotropic media in the microwave region is studied. The measuring structure is a resonator made up of a cylindrical dielectric rod and conducting plates. The dielectric constants and loss tangents are computed from the resonant frequencies, structure dimensions and unloaded Qs of the TE01δ mode. A simple field model is introduced to analyze this resonator structure. Unlike other simple models, this model does not have the defect of low measurement accuracy of dielectric properties. Important factors affecting the dielectric properties measurements are introduced. Error sources for measurements are also discussed. The measurement accuracy is justified by comparing the results with those of other techniques. In addition, various methods for calculating the power factor and conducting loss and for measuring the conductivity of the conducting plates are discussed. The accuracies of certain of these methods have not previously been studied, but are given in this paper. The swept frequency capability was also studied. It was found that dielectric properties in microwave frequencies could be measured within a frequency range of 3 GHz.