Abstract
The paper presents the possibilities offered by the Correlation Spectrum Analyzer in the characterisation of semiconductor materials and microelectronic devices. The instrument performs noise analysis in a frequency range from a few mHz to 1MHz with an extraordinary sensitivity of 1fA/√Hz in current noise measurements and of 20pV/√Hz in voltage noise measurements. Noise spectra taken in these conditions can be used as a non-destructive-sensitive probe to investigate physical properties of semiconductor materials as well as quantify the noise produced by new devices. As an example of these applications, the text reports on the extraction of noise parameters from a MOSFET operated in strong sub-threshold regime to be inserted in noise models for circuit simulation and on the determination of carrier mobility in single-crystal cadmium telluride (CdTe) samples.
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