Abstract
Thin films of magnetic materials are useful in a variety of optical device applications because of their ability to impart non-reciprocal effects into oppositely traveling light eaves. This paper presents explicit formulas for the evaluation of non-reciprocal transverse Kerr reflectance and phase shift produced by a transparent magnetic thin film on a transparent substrate. To compare the prediction of theory with experiments, a set of thin film permalloy coatings was deposited using the ion beam sputtering process while non-reciprocal effects were measured by a modulated magneto-optic ellipsometer. There was observed a good match between the theory and experimental data.
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