Abstract

Determination of planar waveguide parameters with a deposited thin layer such as a refractive index and thickness by the method of m-line spectroscopy is possible. Application of the method to determination of thin film parameters of anisotropy material has been presented in this paper. Depositing of a very small quantity of the material on the planar waveguide changes propagation depending on a texture of a crystal. Liquid crystal (LC) is typical material characterizing the texture. Optical parameters of anisotropic materials (LC) have been determined by the modified m-line spectroscopy in four-layer waveguide structures. Preliminary investigation of application of this method to the study of anisotropic materials has been confirmed.

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