Abstract

Parameters of a waveguide may be investigated with great resolution by using the m-line spectroscopy method. By depositing successive layers on the waveguide the propagation conditions of the structure may be changed. In this paper investigations of multilayer waveguide structures by the generalized m-line spectroscopy method have been presented. Multilayer waveguide structure is constructed by depositing successive layers on gradient index waveguide performed in glass by the ion-exchange method. The depositing layers are optimally selected in order to estimate their refractive indices, thicknesses and other parameters.

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