Abstract
This chapter describes Low energy electron microscopy (LEEM) and several other imaging, diffraction and spectroscopy methods, which can be combined with LEEM in the same instrument, and illustrates their application in condensed matter physics by a number of examples. After a discussion of the fundamental electron-solid interactions on which these methods are based an overview over the instrumentation needed for them is presented. The application examples include studies of clean surface, chemical reactions on surfaces, oxidation, growth and structure of thin films without and with gas/substrate reaction, electronic structure determination on the sub-micron scale and applications in thin film magnetism.
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