Abstract
Spin Polarized Low Energy Electron Microscopy (SPLEEM) is an extension of the well established Low Energy Electron Microscopy (LEEM) 1 technique with added sensitivity to surface magnetism due to the use of spin polarized electrons in the illuminating beam. SPLEEM uses parallel imaging of all image elements as LEEM does and, therefore, has the potential to study the time dependence of the magnetic surface structure. Because magnetic contrast is smaller than the usual diffraction, interference and topographic contrast and because of limitations in gun brightness and speed in data aquisition and storage, a time resolution corresponding to standard video rates as in LEEM is not possible at present. However, in this contribution we demonstrate that changes in the magnetic domain structure during growth and annealing of thin Co films can be easily resolved on times scales of seconds. This may be compared with other magnetic microscopies which provide similar resolution like special contrast modes in Scanning Transmission Electron Microscopy (STEM) 2 and, in addition, similar surface sensitivity like Scanning Electron Microscopy with Polarization Analysis (SEMPA)3.
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