Abstract
Nb ∕ Al 2 O 3 ∕ Ni 0.6 Cu 0.4 ∕ Nb based superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a thickness step in the metallic ferromagnetic Ni0.6Cu0.4 interlayer were fabricated. The step was defined by optical lithography and controlled etching. The step height is on the scale of a few angstroms. Experimentally determined junction parameters by current-voltage characteristics and Fraunhofer pattern indicate uniform ferromagnetic layer thicknesses and the same interface transparencies for etched and nonetched F layers. This technique could be used to tailor low-Tc Josephson junctions having controlled critical current densities at defined parts of the junction area, as needed for tunable resonators, magnetic-field driven electronics, or phase modulated devices.
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